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2019

Autoren Titel Verweis
R. Hönig, P. Roese, K. Shamout, T. Ohkochi, U. Berges, and C. Westphal Structural, chemical, and magnetic properties of cobalt intercalated graphene on silicon carbide Nanotechnology 30, 025702 (2019)
doi: 10.1088/1361-6528/aae8c9
P. Roese, K. Shamout, P. Espeter, R. Hönig, U. Berges, and C. Westphal Structure determination of substrate influenced silicon nano-ribbon growth Applied Surface Science (2019),
doi: 10.1016/j.apsusc.2018.10.195

2018

Autoren Titel Verweis
K. Shamout, P. Espeter, P. Roese, R. Hönig, U. Berges, and C. Westphal Revealing the interfaces of the hybrid system
MgO/Co/GaAs(0 0 1): a structural and chemical investigation
with XPS and XPD
Journal of Physics: Condensed Matter 30, 0750003 (2018)
doi: 10.1088/1361-648X/aaa579

   

2017

Autoren Titel Verweis
P. Espeter, C. Keutner, P. Roese, K. Shamout, U. Berges, G. Wenzel, L. Bignardi, N. F. Kleimeier, H. Zacharias, and C. Westphal Facing the interaction of adsorbed silicon nano-ribbons on silver

Nanotechnology 28, 455701 (2017)
doi: 10.1088/1361-6528/aa9012

P. Espeter, C. Keutner, N.F. Kleimeier, P. Roese, K. Shamout, G.Wenzel, U. Berges, H. Zacharias, and C. Westphal Structure determination of silicene nanoribbons on Ag(110)

TechConnect Briefs: Advanced Materials 1 (2017)

P. Roese, C. Keutner, U. Berges, P. Espeter, and C. Westphal Photoemission Electron Microscopy as a Tool for Studying Steel Grains

Metall and Mat Trans A (2017) doi: 10.1007/s11661-016-3911-y

2016

Autoren Titel Verweis
D. Krull, M.F. Tesch, F. Schönbohm, T. Lühr, C. Keutner, U. Berges, H.-Ch. Mertins, and C. Westphal A detailed look beneath the surface: Evidence of a surface reconstruction beneath a capping layer Applied Surface Science 2016, doi:10.1016/j.apsusc.2016.01.162
T. Lühr, A. Winkelmann, G. Nolze, D. Krull, and C. Westphal Direct atom imaging by chemical-sensitive holography Nano Letters 2016, 16 (5), pp 3195-3201 doi:10.1021/acs.nanolett.6b00524

2015

Autoren Titel Verweis
C. Keutner, A. von Bohlen, U. Berges, P. Espeter, C. M. Schneider and C. Westphal Insight into bacteria: magnetosomes chains under photoemission electron and scanning electron microscopes NSTI-Nanontech Vol. 1, pp: 1-4 (2015)

   

2014

Autoren Titel Verweis
L. H. de Lima,  D. Handschak, F. Schönbohm, R. Landers, C. Westphal and A. de Siervo The atomic structure of a bare buffer layer on SiC(0001) chemically resolved Chem. Commun., 50 (88), 13571-13574 (2014)
C. Keutner, A. von Bohlen, U. Berges, P. Espeter, D.J. Keavney, C.M. Schneider, and C. Westphal Photoemission electron microscopy and scanning electron microscopy of Magnetospirillum magnetotacticum's magnetosome chains Ana. Chem. 86 (19), 9590-9594 (2014)
 

2013

Autoren Titel Verweis
D. Handschak, T. Lühr, F. Schönbohm, S. Döring, C. Keutner, U. Berges, and C. Westphal Structural investigation of the three-layer system MgO/Fe/GaAs(001) by means of photoelctron spectroscopy and diffraction Phys. Rev. B 88, 045313 (2013)
D. Handschak, F. Schönbohm, T. Lühr, C. Keutner, U. Berges, and C. Westphal Investigation of the MgO absorbate and the MgO/Fe on GaAs(001) surface by means of XPS and XPD

NSTI Nanontech, Vol. 1 pp: 105-108 (2013)

S. Döring, F. Schönbohm, U. Berges, D.E. Bürgler, C.M. Schneider, M. Gorgoi, F. Schäfers, and C. Westphal Hard x-ray photoemission spectroscopy on the trilayer system MgO/Au/Fe using standing-wave excitation J. Phys. D: Appl. Phys. 46, 375001 (2013)
L. El-Kareh, P. Mehring, V. Caciuc, N. Atodiresei, A. Beimborn, S. Blügel, C. Westphal Self-assembled monolayers of methylselenolate on the Au(111) surface: A combined STM and DFT study Surf. Sci. 619, 67-70  (2013)
K. Skaja, F. Schönbohm, D. Weier, T. Lühr, C. Keutner, U. Berges, and C. Westphal Thermal stability of an ultrathin hafnium oxide film on plasma nitrided Si(100) Surf. Sci. 616, 104-109 (2013)
A. Beimborn, E. Henschel, and C. Westphal Morphology and growth of hafnium silicide on Si(111) Applied Surface Science 265, 1-3 (2013)

 

2012

Autoren Titel Verweis
Patrick Mehring and Carsten Westphal Naphthalocyanine on Au Surfaces: Adsorption and Structural Formation Imaging & Microscopy Issue 4 (2012)
Patrick Mehring, Axel Beimborn, Tobias Lühr, and Carsten Westphal Metal-free naphthalocyanine structures on Au(100) at submonolayer coverage J. Phys. Chem. C, 116, 12819−12823 (2012)

 

2011

Autoren Titel Verweis
S.-H. Yang, B. Balke, C. Papp, S. Döring, U. Berges, L. Plucinski, C. Westphal, C.M. Schneider, S.S.P. Parkin, and C.S. Fadley Determination of layer-resolved composition, magnetization, and electronic structure of an Fe/MgO tunnel junction by standing-wave core and valence photoemission Phys. Rev. B 84, 184410 (2011)
S. Döring, F. Schönbohm, U. Berges, R. Schreiber, D. E. Bürgler, C.M. Schneider, M. Gorgoi, F. Schäfers, C. Papp, B. Balke, C.S. Fadley, and C. Westphal Hard x-ray photoemission studies using standing wave excitation applied to the MgO/Fe interface Phys. Rev. B 83, 165444 (2011)
D. Weier, T. Lühr, A. Beimborn, F. Schönbohm, S. Döring, U. Berges, and C. Westphal The local adsorption of pyridine on Si(100) a combined PES and XPD study Surf. Sci. 605, 1784 (2011)
 

2010

Autoren Titel Verweis
P. Mehring, A. Beimborn, and C. Westphal The structural formation of methylthiolate SAMs on Au(111) for short deposition times from solution Appl. Surf. Sci. 256, 7265 (2010)
M. F. Carazzolle, C. R. Flüchter, A. de Siervo, A. Pancotti, D. Weier, M. Schürmann, C. Westphal, R. Landers, and G. G. Kleiman Solving the thermal stability problem at the HfO2 /Si interface with previous N implantation J. Appl. Phys. 107, 056101 (2010)
D. Weier, T. Lühr, A. Beimborn, F. Schönbohm, S. Döring, U. Berges, and C. Westphal Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100) Surf. Sci. 604, 1608 (2010)

 

2009

Autoren Titel Verweis
S. Döring, F. Schönbohm, D. Weier, F. Lehmkühler, U. Berges, M. Tolan, C.S. Fadley, and C. Westphal Standing-wave excited photoemission experiments on Si/MoSi2 multilayer mirrors in the soft x-ray regime: an analytical modeling approach Journal of Applied Physics 106, 124906 (2009)
F. Schönbohm, C. R. Flüchter, T. Lühr, U. Berges, S. Döring, C. Westphal Thermal stability of ultra-thin ZrO2 films and structure determination of ZrSi2 islands on Si(100) Phys. Rev. B 80, 165323 (2009)
 

2008

Autoren Titel Verweis
C.R. Flüchter, D. Weier, M. Schürmann, U. Berges, S. Döring, and C. Westphal Evolution of chemical states within the Hf interface upon annealing, prepared by direct electron beam heating Surf. Sci. 602, 2623 (2008)
C.R. Flüchter, A. de Siervo, D. Weier, M. Schürmann, A. Beimborn, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman, and C. Westphal Structure determination of three-dimensional hafnium silicide nanostructures on Si(100) by menas of x-ray photoelectron diffraction Surf. Sci. 602, 3647 (2008)

 

2007

Autoren Titel Verweis
U. Berges, C. Sternemann, M. Tolan, C. Westphal, T. Weis, K. Wille Status of the Synchrotron Light Source DELTA AIP Conf. Proc. 879, 30-33 (2007)
U. Berges, S. Döring, C. Westphal The PGM-Beamline at the Undulator U55 at DELTA AIP Conf. Proc. 879, 519-522 (2007)
U. Berges, S. Döring, C. Westphal The TGM-Beamline at DELTA AIP conference proceedings 879, 583 (2007)
M. Schürmann, S. Dreiner, U. Berges, C. Westphal, Ultrathin SiO2-films on 4H-SiC(0001) studied by angle-scanned photoelectron diffraction J. Electron. Spectrosc. Relat. Phenom. 156-158, 119 (2007)
M.F. Carazzolle, M. Schürmann, C.R. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G.G. Kleiman and C. Westphal Structural and electronic analysis of Hf on Si(111) surface studied by XPS, LEED and XPD J. Electron. Spectrosc. Relat. Phenom. 156-158, 393 (2007)
C.R. Flüchter, D. Weier, A. de Siervo, M. Schürmann, U. Berges, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman and C. Westphal Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on Silicon(100) using MgK–radiation and synchrotron light (Link) Journal of Electron Spectroscopy and Related Phenomena 156–158, 92–96 (2007)

 

2006

Autoren Titel Verweis
M. Schürmann, S. Dreiner, U. Berges and C. Westphal Investigation of carbon contaminations in SiO2-films on 4H-SiC(0001) Journal of Applied Physics 100, 113510 (2006)
C.R. Flüchter, D. Weier, S. Dreiner, M. Schürmann, U. Berges, M.F. Carazzolle, A. Pancotti, A. de Siervo, R. Landers, G.G. Kleiman and C. Westphal Structure analysis of the system Hafnium/Silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD) Materials Science in Semiconductor Processing 9, 1049 (2006)
D. Weier, C.R. Flüchter, A. de Siervo, M. Schürmann, S. Dreiner, U. Berges, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman and C. Westphal Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system Hafnium silicide and Hafnium oxide on Si(100) Materials Science in Semiconductor Processing 9, 1055 (2006)
M. Schürmann, S. Dreiner, U. Berges and C. Westphal Structure of the interface between ultrathin SiO2 films and 4H-SiC(0001) Phys. Rev. B 74, 035309 (2006)
A. de Siervo, C. Flüchter, D. Weier, M. Schürmann, S. Dreiner, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman, and C. Westphal Hafnium Silicide formation on Si(100) upon annealing Phys. Rev. B 74, 075319 (2006)

 

2005

Autoren Titel Verweis
C. Westphal, U. Berges, S. Dreiner, R. Follath, M. Krause, F. Schäfers, D. Schirmer and M. Schürmann The plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA J. Electron. Spectrosc. Relat. Phenom. 144-147, 1117-1123 (2005)
S. Dreiner, M. Schürmann, M. Krause, U. Berges and C. Westphal Determination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(100) interface (Link) Journal of Electron Spectroscopy and Related Phenomena 144-147, 405-408 (2005)

 

2004

Autoren Titel Verweis
U. Berges, M. Krause and C. Westphal Status of the Dortmund TGM3-beamline AIP Conference Proceedings 705, 420 (2004)
U. Berges, M. Krause, M. Schürmann, S. Dreiner, R. Follath, F. Schäfers and C. Westphal The PGM-beamline at the undulator U55 at DELTA AIP Conference Proceedings 705, 424 (2004)
U. Berges, J. Friedl, P. Hartmann, D. Schirmer, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal and K. Wille Status Of The Synchrotron Light Source DELTA AIP Conference Proceedings 705, 77 (2004)
C. Westphal Buried interfaces studied by photoelectron diffraction Applied Physics A: Materials Science & Processing 76, 721 (2004)
S. Dreiner, M. Schürmann and C.Westphal Investigation of the SiO2/Si(100) interface structure by means of angle-scanned photoelectron spectroscopy and diffraction Journal of Electron Spectroscopy and Related Phenomena 137-140, 79 (2004)
S. Dreiner, M. Schürmann, C. Westphal Structural Analysis of the SiO2/Si(100) Interface by Means of Photoelectron Diffraction Phys. Rev. Lett. 93, 126101 (2004)
D. Schirmer, U. Berges, J. Friedl, A. Gasper, M. Grewe, P. Hartmann, R.G. Heine, H. Huck, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal, K. Wille Status of the Synchrotron Light Source DELTA Proceedings of EPAC 2004 , 2293 (2004) (Link)

 

2003

Autoren Titel Verweis
M. Schürmann, S. Dreiner, U. Berges, C. Westphal Sb/Si(1 1 0) 2×3—a photoelectron diffraction study Applied Surface Science 212-213, 131 (2003)
C. Westphal The study of the local atomic structure by means of X-ray photoelectron diffraction Surface Science Reports 50, 1 (2003)
M. Tolan, T. Weis, C. Westphal, K. Wille DELTA: Synchrotron Light in Nordrhein-Westfalen Synchrotron Radiation News 16(2), 9 (2003)
S. Dreiner, C. Westphal, M. Schürmann, H. Zacharias Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2×1-reconstructed Si(100) surfaces Thin Solid Films 428, 123 (2003)

 

2002

Autoren Titel Verweis
C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias The transition from amorphous silicon oxide to crystalline silicon studied by photoelectron diffraction Surface Review and Letters 9, 735 (2002)

 

2001

Autoren Titel Verweis
C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias Investigation of the (√3×√3)R30° Sb/Si(111) structure by means of X-ray photoelectron diffraction Journal of Electron Spectroscopy and Related Phenomena 114-116, 437 (2001)
S. Dreiner, M. Schürmann, C. Westphal and H. Zacharias Local Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction Phys. Rev. Lett. 86, 4068 (2001)

 

2000

Autoren Titel Verweis
C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias Holographic reconstruction of Si(111) atom positions from energy- and angle-resolved photoelectron diffraction Surface Science 462, 103 (2000)

 

1999

Autoren Titel Verweis
F. Sökeland, C. Westphal, S. Dreiner and H. Zacharias On the separability of relativistic electron propagators The European Physical Journal B 9, 577 (1999)

 

1998

Autoren Titel Verweis
S. Dreiner, C. Westphal, F. Sökeland, H. Zacharias Surfactant mediated heteroepitaxial growth of Ge/Si(111) probed by X-ray photoelectron diffraction Applied Surface Science 123-124, 610 (1998)
C. Westphal, F. Sökeland, S. Dreiner, H. Zacharias Epitaxial Growth of Sb/Ge/Si(111) Studied by Photoelectron Diffraction Surface Review and Letters 5, 151 (1998)
C. Westphal, S. Dreiner, F. Sökeland, H. Zacharias Photoelectron diffraction as a tool for the study of a buried interface during heteroepitaxial growth of Sb/Ge/Si(111) Surface Science 396, 87 (1998)