Publikationsliste AG Westphal

2008:

AutorenTitelVerweis
C.R. Flüchter, D. Weier, M. Schürmann, U. Berges, S. Döring, and C. WestphalEvolution of chemical states within the Hf interface upon annealing, prepared by direct electron beam heating Surf. Sci. 602, 2623 (2008)
C.R. Flüchter, A. de Siervo, D. Weier, M. Schürmann, A. Beimborn, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman, and C. WestphalStructure determination of three-dimensional hafnium silicide nanostructures on Si(100) by menas of x-ray photoelectron diffractionSurf. Surf. Sci. 602, 3647 (2008)

2007:

AutorenTitelVerweis
U. Berges, C. Sternemann, M. Tolan, C. Westphal, T. Weis, K. WilleStatus of the Synchrotron Light Source DELTA AIP Conf. Proc. 879, 30-33 (2007)
U. Berges, S. Döring, C. WestphalThe PGM-Beamline at the Undulator U55 at DELTA AIP Conf. Proc. 879, 519-522 (2007)
U. Berges, S. Döring, C. WestphalThe TGM-Beamline at DELTA AIP conference proceedings 879, 583 (2007)
M. Schürmann, S. Dreiner, U. Berges, C. Westphal,Ultrathin SiO2-films on 4H-SiC(0001) studied by angle-scanned photoelectron diffraction J. Electron. Spectrosc. Relat. Phenom. 156-158, 119 (2007)
M.F. Carazzolle, M. Schürmann, C.R. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G.G. Kleiman and C. WestphalStructural and electronic analysis of Hf on Si(111) surface studied by XPS, LEED and XPD J. Electron. Spectrosc. Relat. Phenom. 156-158, 393 (2007)
C.R. Flüchter, D. Weier, A. de Siervo, M. Schürmann, U. Berges, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman and C. WestphalPhotoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on Silicon(100) using MgK–radiation and synchrotron light (Link)Journal of Electron Spectroscopy and Related Phenomena 156–158, 92–96 (2007)

2006:

AutorenTitelVerweis
M. Schürmann, S. Dreiner, U. Berges and C. WestphalInvestigation of carbon contaminations in SiO2-films on 4H-SiC(0001) (Link)Journal of Applied Physics 100, 113510 (2006)
C.R. Flüchter, D. Weier, S. Dreiner, M. Schürmann, U. Berges, M.F. Carazzolle, A. Pancotti, A. de Siervo, R. Landers, G.G. Kleiman and C. WestphalStructure analysis of the system Hafnium/Silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD) (Link)Materials Science in Semiconductor Processing 9, 1049 (2006)
D. Weier, C.R. Flüchter, A. de Siervo, M. Schürmann, S. Dreiner, U. Berges, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman and C. WestphalPhotoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system Hafnium silicide and Hafnium oxide on Si(100) (Link)Materials Science in Semiconductor Processing 9, 1055 (2006)
M. Schürmann, S. Dreiner, U. Berges and C. WestphalStructure of the interface between ultrathin SiO2 films and 4H-SiC(0001) (Link)Phys. Rev. B 74, 035309 (2006)
A. de Siervo, C. Flüchter, D. Weier, M. Schürmann, S. Dreiner, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman, and C. WestphalHafnium Silicide formation on Si(100) upon annealing (Link)Phys. Rev. B 74, 075319 (2006)

2005:

AutorenTitelVerweis
C. Westphal, U. Berges, S. Dreiner, R. Follath, M. Krause, F. Schäfers, D. Schirmer and M. SchürmannThe plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA J. Electron. Spectrosc. Relat. Phenom. 144-147, 1117-1123 (2005)
C. Westphal, U. Berges, S. Dreiner, R. Follath, M. Krause, F. Schäfers, D. Schirmer, and M. Schürmann,The plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA J. Electron. Spectrosc. Relat. Phenom. 144-147, 1117-1123 (2005)
S. Dreiner, M. Schürmann, M. Krause, U. Berges and C. WestphalDetermination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(100) interface (Link)Journal of Electron Spectroscopy and Related Phenomena 144-147, 405-408 (2005)

2004:

AutorenTitelVerweis
U. Berges, M. Krause and C. WestphalStatus of the Dortmund TGM3-beamline (Link)AIP Conference Proceedings 705, 420 (2004)
U. Berges, M. Krause, M. Schürmann, S. Dreiner, R. Follath, F. Schäfers and C. WestphalThe PGM-beamline at the undulator U55 at DELTA (Link)AIP Conference Proceedings 705, 424 (2004)
U. Berges, J. Friedl, P. Hartmann, D. Schirmer, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal and K. WilleStatus Of The Synchrotron Light Source DELTA (Link)AIP Conference Proceedings 705, 77 (2004)
C. WestphalBuried interfaces studied by photoelectron diffraction (Link)Applied Physics A: Materials Science & Processing 76, 721 (2004)
S. Dreiner, M. Schürmann and C.WestphalInvestigation of the SiO2/Si(100) interface structure by means of angle-scanned photoelectron spectroscopy and diffraction (Link)Journal of Electron Spectroscopy and Related Phenomena 137-140, 79 (2004)
S. Dreiner, M. Schürmann, C. WestphalStructural Analysis of the SiO2/Si(100) Interface by Means of Photoelectron Diffraction (Link)Phys. Rev. Lett. 93, 126101 (2004)
D. Schirmer, U. Berges, J. Friedl, A. Gasper, M. Grewe, P. Hartmann, R.G. Heine, H. Huck, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal, K. WilleStatus of the Synchrotron Light Source DELTA (Link)Proceedings of EPAC 2004 , 2293 (2004)

2003:

AutorenTitelVerweis
M. Schürmann, S. Dreiner, U. Berges, C. WestphalSb/Si(1 1 0) 2×3—a photoelectron diffraction study (Link)Applied Surface Science 212-213, 131 (2003)
C. WestphalThe study of the local atomic structure by means of X-ray photoelectron diffraction (Link)Surface Science Reports 50, 1 (2003)
M. Tolan, T. Weis, C. Westphal, K. WilleDELTA: Synchrotron Light in Nordrhein-Westfalen Synchrotron Radiation News 16(2), 9 (2003)
S. Dreiner, C. Westphal, M. Schürmann, H. ZachariasAngle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2×1-reconstructed Si(100) surfaces (Link)Thin Solid Films 428, 123 (2003)

2002:

AutorenTitelVerweis
C. Westphal, S. Dreiner, M. Schürmann, H. ZachariasThe transition from amorphous silicon oxide to crystalline silicon studied by photoelectron diffraction (Link)Surface Review and Letters 9, 735 (2002)

2001:

AutorenTitelVerweis
C. Westphal, S. Dreiner, M. Schürmann, H. ZachariasInvestigation of the (√3×√3)R30° Sb/Si(111) structure by means of X-ray photoelectron diffraction (Link)Journal of Electron Spectroscopy and Related Phenomena 114-116, 437 (2001)
S. Dreiner, M. Schürmann, C. Westphal and H. ZachariasLocal Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction (Link)Phys. Rev. Lett. 86, 4068 (2001)

2000:

AutorenTitelVerweis
C. Westphal, S. Dreiner, M. Schürmann, H. ZachariasHolographic reconstruction of Si(111) atom positions from energy- and angle-resolved photoelectron diffraction (Link)Surface Science 462, 103 (2000)

1999:

AutorenTitelVerweis
F. Sökeland, C. Westphal, S. Dreiner and H. ZachariasOn the separability of relativistic electron propagators (Link)The European Physical Journal B 9, 577 (1999)

1998:

AutorenTitelVerweis
S. Dreiner, C. Westphal, F. Sökeland, H. ZachariasSurfactant mediated heteroepitaxial growth of Ge/Si(111) probed by X-ray photoelectron diffraction (Link)Applied Surface Science 123-124, 610 (1998)
C. Westphal, F. Sökeland, S. Dreiner, H. ZachariasEpitaxial Growth of Sb/Ge/Si(111) Studied by Photoelectron Diffraction (Link)Surface Review and Letters 5, 151 (1998)
C. Westphal, S. Dreiner, F. Sökeland, H. ZachariasPhotoelectron diffraction as a tool for the study of a buried interface during heteroepitaxial growth of Sb/Ge/Si(111) (Link)Surface Science 396, 87 (1998)