2024

• Structural, chemical, and magnetic investigation of a graphene/cobalt/platinum multilayer system on silicon carbide
  Philipp Weinert, Julian A. Hochhaus, Lukas Kesper, Robert Appel, Stefanie Hilgers, Marie Schmitz, Malte G. H. Schulte, Richard Hönig, Florian Kronast, Sergio Valencia, Mattias Kruskopf, Atasi Chatterjee, Ulf Berges, and Carsten Westphal
  Nanotechnology 35, 165702 (2024)

2022

• Tracing the structural evolution of quasi-freestanding germanene on Ag(111)
  Lukas Kesper, Julian A. Hochhaus, Marie Schmitz, Malte G. H. Schulte, Ulf Berges, and Carsten Westphal
  Sci. Rep. 12, 7559 (2022)
• Revealing the nano-structures of low-dimensional germanium on Ag(1 1 0) using XPS and XPD
  Lukas Kesper, Marie Schmitz, Malte G. H. Schulte, Ulf Berges, and Carsten Westphal
  Appl. Nanosci. 12, 2151-2160 (2022)
• Rare-earth modified amorphous carbon films: Effects of erbium and gadolinium on the structural evolution and mechanical properties
  Wolfgang Tillmann, Nelson Filipe Lopes Dias, Dominic Stangier, Jasper Berndt, Stephan Klemme, Lukas Kesper, Ulf Berges, Carsten Westphal, Carl Arne Thomann, and Jörg Debus
  Diam. Relat. Mater. 123, 108898 (2022)
• Electron holography by planar electron backscattered diffraction patterns
  Matthias Gianfelice and Carsten Westphal
  J. Opt. Soc. Am. A 39, A1-A6 (2022)

2021

• Surface and interface analysis of a low-dimensional Au-Si surface alloy on Au(110) by means of XPS and XPD
  Marie Schmitz, Lukas Kesper, Malte G. H. Schulte, Peter Roese, Ulf Berges, and Carsten Westphal
  J. Phys.: Condens. Matter 33 275001 (2021)
• On the synthesis and structural evolution of artificial CrN/TiN nanocomposites
  Wolfgang Tillmann, David Kokalj, Dominic Stangier, Qingqing Fu, Frank Einar Kruis, Lukas Kesper, Ulf Berges, and Carsten Westphal
  Appl. Surf. Sci. 535, 147736 (2021)
• Simulated Imaging of Atomic Surface-Structures via Holographic Approaches by Planar Electron Backscattered Diffraction Patterns
  Matthias Gianfelice and Carsten Westphal
  OSA Technical Digest JTu5A.22 (2021)

2020

• Structural Analysis of Theobromine Monolayers on Weakly Interacting Surfaces
  Ismail Baltaci, Malte G. H. Schulte, and Carsten Westphal
  J. Phys. Chem. C 2020, 124, 43, 23648-23656 (2020)

• Structural investigation of caffeine monolayers on Au(111)
  Malte G. H. Schulte, Andreas Jeindl, Ismail Baltaci, Peter Roese, Marie Schmitz, Ulf Berges, Oliver T. Hofmann, and Carsten Westphal
  Phys. Rev. B 101, 245414 (2020)

2019

• Structural and mechanical properties of carbon incorporation in DC/HiPIMS CrAlN coatings
  W. Tillmann, D. Stangier, P. Roese, K. Shamout, U. Berges, C. Westphal, and J. Debus
  Surf. Coat. Technol. 374, 774 (2019)

• Interaction effects of cathode power, bias voltage, and mid-frequency on the structural and mechanical properties of sputtered amorphous carbon films
  W. Tillmann, N. F. Lopes Dias, D. Stangier, M. Bayer, H. Moldenhauer, J. Debus, M. Schmitz, U. Berges, and C. Westphal
  Appl. Surf. Sci. 487, 857 (2019)

• Structural, chemical, and magnetic properties of cobalt intercalated graphene on silicon carbide
  R. Hönig, P. Roese, K. Shamout, T. Ohkochi, U. Berges, and C. Westphal
  Nanotechnology 30, 025702 (2019)

• Structure determination of substrate influenced silicon nano-ribbon growth
  P. Roese, K. Shamout, P. Espeter, R. Hönig, U. Berges, and C. Westphal
  Appl. Surf. Sci. 467, 580 (2019)

2018

• Revealing the interfaces of the hybrid system MgO/Co/GaAs(0 0 1): a structural and chemical investigation with XPS and XPD
  K. Shamout, P. Espeter, P. Roese, R. Hönig, U. Berges, and C. Westphal
  Journal of Physics: Condensed Matter 30, 0750003 (2018)

2017

• Facing the interaction of adsorbed silicon nano-ribbons on silver
  P. Espeter, C. Keutner, P. Roese, K. Shamout, U. Berges, G. Wenzel, L. Bignardi, N. F. Kleimeier, H. Zacharias, and C. Westphal
  Nanotechnology 28, 455701 (2017)
• Structure determination of silicene nanoribbons on Ag(110)
  P. Espeter, C. Keutner, N.F. Kleimeier, P. Roese, K. Shamout, G.Wenzel, U. Berges, H. Zacharias, and C. Westphal
  TechConnect Briefs: Advanced Materials 1 (2017)
• Photoemission Electron Microscopy as a Tool for Studying Steel Grains
  P. Roese, C. Keutner, U. Berges, P. Espeter, and C. Westphal
  Metall and Mat Trans A (2017)

2016

• A detailed look beneath the surface: Evidence of a surface reconstruction beneath a capping layer
  D. Krull, M.F. Tesch, F. Schönbohm, T. Lühr, C. Keutner, U. Berges, H.-Ch. Mertins, and C. Westphal
  Applied Surface Science 2016
• Direct atom imaging by chemical-sensitive holography
  T. Lühr, A. Winkelmann, G. Nolze, D. Krull, and C. Westphal
  Nano Letters 16 (5), 3195-3201 (2016)

2015

• Insight into bacteria: magnetosomes chains under photoemission electron and scanning electron microscopes
  C. Keutner, A. von Bohlen, U. Berges, P. Espeter, C. M. Schneider and C. Westphal
  NSTI-Nanontech 1, pp: 1-4 (2015)

2014

• The atomic structure of a bare buffer layer on SiC(0001) chemically resolved
  L. H. de Lima,  D. Handschak, F. Schönbohm, R. Landers, C. Westphal and A. de Siervo
  Chem. Commun. 50 (88), 13571-13574 (2014)
• Photoemission electron microscopy and scanning electron microscopy of Magnetospirillum magnetotacticum's magnetosome chains
  C. Keutner, A. von Bohlen, U. Berges, P. Espeter, D.J. Keavney, C.M. Schneider, and C. Westphal
  Ana. Chem. 86 (19), 9590-9594 (2014)

2013

• Structural investigation of the three-layer system MgO/Fe/GaAs(001) by means of photoelctron spectroscopy and diffraction
  D. Handschak, T. Lühr, F. Schönbohm, S. Döring, C. Keutner, U. Berges, and C. Westphal
  Phys. Rev. B 88, 045313 (2013)

• Investigation of the MgO absorbate and the MgO/Fe on GaAs(001) surface by means of XPS and XPD
  D. Handschak, F. Schönbohm, T. Lühr, C. Keutner, U. Berges, and C. Westphal
  NSTI Nanontech, Vol. 1 pp: 105-108 (2013)

• Hard x-ray photoemission spectroscopy on the trilayer system MgO/Au/Fe using standing-wave excitation
  S. Döring, F. Schönbohm, U. Berges, D.E. Bürgler, C.M. Schneider, M. Gorgoi, F. Schäfers, and C. Westphal
  J. Phys. D: Appl. Phys. 46, 375001 (2013)

• Self-assembled monolayers of methylselenolate on the Au(111) surface: A combined STM and DFT study
  L. El-Kareh, P. Mehring, V. Caciuc, N. Atodiresei, A. Beimborn, S. Blügel, C. Westphal
  Surf. Sci. 619, 67-70  (2013)

• Thermal stability of an ultrathin hafnium oxide film on plasma nitrided Si(100)
  K. Skaja, F. Schönbohm, D. Weier, T. Lühr, C. Keutner, U. Berges, and C. Westphal
  Surf. Sci. 616, 104-109 (2013)

• Morphology and growth of hafnium silicide on Si(111)
  A. Beimborn, E. Henschel, and C. Westphal
  Applied Surface Science 265, 1-3 (2013)

2012

• Naphthalocyanine on Au Surfaces: Adsorption and Structural Formation
  Patrick Mehring and Carsten Westphal
  Imaging & Microscopy Issue 4 (2012)
• Metal-free naphthalocyanine structures on Au(100) at submonolayer coverage
  Patrick Mehring, Axel Beimborn, Tobias Lühr, and Carsten Westphal    
  J. Phys. Chem. C 116, 12819−12823 (2012)

2011

• Determination of layer-resolved composition, magnetization, and electronic structure of an Fe/MgO tunnel junction by standing-wave core and valence photoemission
  S.-H. Yang, B. Balke, C. Papp, S. Döring, U. Berges, L. Plucinski, C. Westphal, C.M. Schneider, S.S.P. Parkin, and C.S. Fadley    
  Phys. Rev. B 84, 184410 (2011)
• Hard x-ray photoemission studies using standing wave excitation applied to the MgO/Fe interface
  S. Döring, F. Schönbohm, U. Berges, R. Schreiber, D. E. Bürgler, C.M. Schneider, M. Gorgoi, F. Schäfers, C. Papp, B. Balke, C.S. Fadley, and C. Westphal    
  Phys. Rev. B 83, 165444 (2011)
• The local adsorption of pyridine on Si(100) a combined PES and XPD study
  D. Weier, T. Lühr, A. Beimborn, F. Schönbohm, S. Döring, U. Berges, and C. Westphal    
  Surf. Sci. 605, 1784 (2011)

2010

• The structural formation of methylthiolate SAMs on Au(111) for short deposition times from solution
  P. Mehring, A. Beimborn, and C. Westphal    
  Appl. Surf. Sci. 256, 7265 (2010)
• Solving the thermal stability problem at the HfO2 /Si interface with previous N implantation
  M. F. Carazzolle, C. R. Flüchter, A. de Siervo, A. Pancotti, D. Weier, M. Schürmann, C. Westphal, R. Landers, and G. G. Kleiman    
  J. Appl. Phys. 107, 056101 (2010)
• Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100)
  D. Weier, T. Lühr, A. Beimborn, F. Schönbohm, S. Döring, U. Berges, and C. Westphal    
  Surf. Sci. 604, 1608 (2010)

2009

• Standing-wave excited photoemission experiments on Si/MoSi2 multilayer mirrors in the soft x-ray regime: an analytical modeling approach
  S. Döring, F. Schönbohm, D. Weier, F. Lehmkühler, U. Berges, M. Tolan, C.S. Fadley, and C. Westphal    
  Journal of Applied Physics 106, 124906 (2009)
• Thermal stability of ultra-thin ZrO2 films and structure determination of ZrSi2 islands on Si(100)
  F. Schönbohm, C. R. Flüchter, T. Lühr, U. Berges, S. Döring, C. Westphal    
  Phys. Rev. B 80, 165323 (2009)

2008

• Evolution of chemical states within the Hf interface upon annealing, prepared by direct electron beam heating
  C.R. Flüchter, D. Weier, M. Schürmann, U. Berges, S. Döring, and C. Westphal    
  Surf. Sci. 602, 2623 (2008)
• Structure determination of three-dimensional hafnium silicide nanostructures on Si(100) by menas of x-ray photoelectron diffraction
  C.R. Flüchter, A. de Siervo, D. Weier, M. Schürmann, A. Beimborn, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman, and C. Westphal  
  Surf. Sci. 602, 3647 (2008)  

2007

• Status of the Synchrotron Light Source DELTA
  U. Berges, C. Sternemann, M. Tolan, C. Westphal, T. Weis, K. Wille    
  AIP Conf. Proc. 879, 30-33 (2007)
• The PGM-Beamline at the Undulator U55 at DELTA
  U. Berges, S. Döring, C. Westphal    
  AIP Conf. Proc. 879, 519-522 (2007)
• The TGM-Beamline at DELTA
  U. Berges, S. Döring, C. Westphal    
  AIP conference proceedings 879, 583 (2007)
• Ultrathin SiO2-films on 4H-SiC(0001) studied by angle-scanned photoelectron diffraction    
  M. Schürmann, S. Dreiner, U. Berges, C. Westphal
  J. Electron. Spectrosc. Relat. Phenom. 156-158, 119 (2007)
• Structural and electronic analysis of Hf on Si(111) surface studied by XPS, LEED and XPD
  M.F. Carazzolle, M. Schürmann, C.R. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G.G. Kleiman and C. Westphal    
  J. Electron. Spectrosc. Relat. Phenom. 156-158, 393 (2007)
• Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on Silicon(100) using MgK–radiation and synchrotron light
  C.R. Flüchter, D. Weier, A. de Siervo, M. Schürmann, U. Berges, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman and C. Westphal    
  Journal of Electron Spectroscopy and Related Phenomena 156–158, 92–96 (2007)

2006

• Investigation of carbon contaminations in SiO2-films on 4H-SiC(0001)
  M. Schürmann, S. Dreiner, U. Berges and C. Westphal   
  Journal of Applied Physics 100, 113510 (2006)
• Structure analysis of the system Hafnium/Silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)
  C.R. Flüchter, D. Weier, S. Dreiner, M. Schürmann, U. Berges, M.F. Carazzolle, A. Pancotti, A. de Siervo, R. Landers, G.G. Kleiman and C. Westphal    
  Materials Science in Semiconductor Processing 9, 1049 (2006)
• Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system Hafnium silicide and Hafnium oxide on Si(100)
  D. Weier, C.R. Flüchter, A. de Siervo, M. Schürmann, S. Dreiner, U. Berges, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman and C. Westphal    
  Materials Science in Semiconductor Processing 9, 1055 (2006)
• Structure of the interface between ultrathin SiO2 films and 4H-SiC(0001)
  M. Schürmann, S. Dreiner, U. Berges and C. Westphal    
  Phys. Rev. B 74, 035309 (2006)
• Hafnium Silicide formation on Si(100) upon annealing
  A. de Siervo, C. Flüchter, D. Weier, M. Schürmann, S. Dreiner, M.F. Carazzolle, A. Pancotti, R. Landers, G.G. Kleiman, and C. Westphal    
  Phys. Rev. B 74, 075319 (2006)

2005

• The plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA
  C. Westphal, U. Berges, S. Dreiner, R. Follath, M. Krause, F. Schäfers, D. Schirmer and M. Schürmann    
  J. Electron. Spectrosc. Relat. Phenom. 144-147, 1117-1123 (2005)
• Determination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(100) interface
  S. Dreiner, M. Schürmann, M. Krause, U. Berges and C. Westphal    
  Journal of Electron Spectroscopy and Related Phenomena 144-147, 405-408 (2005)

2004

• Status of the Dortmund TGM3-beamline
  U. Berges, M. Krause and C. Westphal    
  AIP Conference Proceedings 705, 420 (2004)
• The PGM-beamline at the undulator U55 at DELTA
  U. Berges, M. Krause, M. Schürmann, S. Dreiner, R. Follath, F. Schäfers and C. Westphal    
  AIP Conference Proceedings 705, 424 (2004)
• Status Of The Synchrotron Light Source DELTA
  U. Berges, J. Friedl, P. Hartmann, D. Schirmer, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal and K. Wille    
  AIP Conference Proceedings 705, 77 (2004)
• Buried interfaces studied by photoelectron diffraction
  C. Westphal    
  Applied Physics A: Materials Science & Processing 76, 721 (2004)
• Investigation of the SiO2/Si(100) interface structure by means of angle-scanned photoelectron spectroscopy and diffraction
  S. Dreiner, M. Schürmann and C.Westphal
  Journal of Electron Spectroscopy and Related Phenomena 137-140, 79 (2004)
• Structural Analysis of the SiO2/Si(100) Interface by Means of Photoelectron Diffraction
  S. Dreiner, M. Schürmann, C. Westphal    
  Phys. Rev. Lett. 93, 126101 (2004)
• Status of the Synchrotron Light Source DELTA
  D. Schirmer, U. Berges, J. Friedl, A. Gasper, M. Grewe, P. Hartmann, R.G. Heine, H. Huck, G. Schmidt, C. Sternemann, M. Tolan, T. Weis, C. Westphal, K. Wille    
  Proceedings of EPAC 2004, 2293 (2004)

2003

• Sb/Si(1 1 0) 2×3—a photoelectron diffraction study
  M. Schürmann, S. Dreiner, U. Berges, C. Westphal    
  Applied Surface Science 212-213, 131 (2003)
• The study of the local atomic structure by means of X-ray photoelectron diffraction
  C. Westphal    
  Surface Science Reports 50, 1 (2003)
• DELTA: Synchrotron Light in Nordrhein-Westfalen
  M. Tolan, T. Weis, C. Westphal, K. Wille    
  Synchrotron Radiation News 16 (2), 9 (2003)
• Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2×1-reconstructed Si(100) surfaces
  S. Dreiner, C. Westphal, M. Schürmann, H. Zacharias
  Thin Solid Films 428, 123 (2003)

2002

• The transition from amorphous silicon oxide to crystalline silicon studied by photoelectron diffraction
  C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias
  Surface Review and Letters 9, 735 (2002)

2001

• Investigation of the (√3×√3)R30° Sb/Si(111) structure by means of X-ray photoelectron diffraction
  C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias    
  Journal of Electron Spectroscopy and Related Phenomena 114-116, 437 (2001)
• Local Atomic Environment of Si Suboxides at the SiO2/Si(111) Interface Determined by Angle-Scanned Photoelectron Diffraction
  S. Dreiner, M. Schürmann, C. Westphal and H. Zacharias    
  Phys. Rev. Lett. 86, 4068 (2001)

2000

• Holographic reconstruction of Si(111) atom positions from energy- and angle-resolved photoelectron diffraction
  C. Westphal, S. Dreiner, M. Schürmann, H. Zacharias    
  Surface Science 462, 103 (2000)

1999

• On the separability of relativistic electron propagators
  F. Sökeland, C. Westphal, S. Dreiner and H. Zacharias    
  The European Physical Journal B 9, 577 (1999)

1998

• Surfactant mediated heteroepitaxial growth of Ge/Si(111) probed by X-ray photoelectron diffraction
  S. Dreiner, C. Westphal, F. Sökeland, H. Zacharias    
  Applied Surface Science 123-124, 610 (1998)
• Epitaxial Growth of Sb/Ge/Si(111) Studied by Photoelectron Diffraction
  C. Westphal, F. Sökeland, S. Dreiner, H. Zacharias    
  Surface Review and Letters 5, 151 (1998)
• Photoelectron diffraction as a tool for the study of a buried interface during heteroepitaxial growth of Sb/Ge/Si(111)
  C. Westphal, S. Dreiner, F. Sökeland, H. Zacharias    
  Surface Science 396, 87 (1998)