Using various preparation methods, we produce both low-dimensional structures and layer systems. Their electronic and chemical properties and structure are sensitive to minimal changes in, for example, the layer thickness, which we can precisely control down to a fraction of an atomic layer.

We use various methods for investigation. At the university's own 1.5 GeV electron storage ring DELTA, we use a dedicated beamline and the subsequent UHV chamber for XPS and XPD measurements with soft X-rays. In addition to the high-intensity monochromatized undulator radiation, a helium lamp and an X-ray tube are also available. Furthermore, we use scanning tunneling and atomic force microscopy at room and cryogenic temperatures, as well as low-energy electron diffraction for structure elucidation.